Structural Characterization of γ‐Terpinene Thin Films Using Mass Spectroscopy and X‐Ray Photoelectron Spectroscopy

E-ISSN： 1612-8869|12|10|1085-1094

ISSN： 1612-8850

Source： PLASMA PROCESSES AND POLYMERS (ELECTRONIC), Vol.12, Iss.10, 2015-10, pp. : 1085-1094

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films

By Benoist L. Gonbeau D. Pfister-Guillouzo G. Schmidt E. Meunier G. Levasseur A.

Thin Solid Films, Vol. 258, Iss. 1, 1995-03 ,pp. : 110-114

Elsevier

Access to resources Recommend Favorite

Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy

By Solina D.M. Cheary R.W. Swift P.D. Dligatch S. McCredie G.M. Gong B. Lynch P.

Thin Solid Films, Vol. 372, Iss. 1, 2000-09 ,pp. : 94-103

Elsevier

Access to resources Recommend Favorite

X-ray photoelectron spectroscopy and grazing incidence X-ray reflectivity study of silicon nitride thin films

By Li B. Fujimoto T. Fukumoto N. Honda K. Kojima I.

Thin Solid Films, Vol. 334, Iss. 1, 1998-12 ,pp. : 140-144

Elsevier

Access to resources Recommend Favorite

Studies with Ni/Ti multilayer films using X-ray photoelectron spectroscopy and neutron reflectometry: microscopic characterization of structure and chemical composition

By Vedpathak M. Basu S. Gokhale S. Kulkarni S.K.

Thin Solid Films, Vol. 335, Iss. 1, 1998-11 ,pp. : 13-18

Elsevier

Access to resources Recommend Favorite

X-ray photoelectron spectroscopy of highly conducting and amorphous osmium dioxide thin films

By Hayakawa Y. Fukuzaki K. Kohiki S. Shibata Y. Matsuo T. Wagatsuma K. Oku M.

Thin Solid Films, Vol. 347, Iss. 1, 1999-06 ,pp. : 56-59

Elsevier

Access to resources Recommend Favorite