Correlation between the critical layer thickness and the decaytime constant of RHEED oscillations in strained In x Ga 1-x As/GaAs structures

Author: Nemcsics A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.367, Iss.1, 2000-05, pp. : 302-305

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Abstract