Duality metal oxide semiconductor-PN junction in the Al/silicon rich oxide/Si structure as a radiation sensor

Author： Aceves M.   Carrillo J.   Carranza J.   Calleja W.   Falcony C.   Rosales P.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.373, Iss.1, 2000-09, pp. : 134-136

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