In situ reflectance difference spectroscopy of p-type ZnTe:N grown by MBE

Author: Stifter D.   Bonanni A.   Garca-Rocha M.   Schmid M.   Hingerl K.   Sitter H.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.373, Iss.1, 2000-09, pp. : 41-45

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Abstract