Observation of amorphous chromium in modified C4 flip chip solder joints after thermal stress testing

Author: Hooghan T.K.   Nakahara S.   Hooghan K.   Privette R.W.   Bachman M.A.   Moyer R.S.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.437, Iss.1, 2003-08, pp. : 235-241

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Abstract