Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry

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Elsevier

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Thickness and quality of spin-coated polymer films by two-angle ellipsometry

By Walsh C.B.   Franses E.I.  

Thin Solid Films, Vol. 347, Iss. 1, 1999-06 ,pp. : 167-177

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Annealing effects on silicon-rich oxide films studied by spectroscopic ellipsometry

By Spiga S.   Tallarida G.   Borghesi A.   Sassella A.   De Santi G.  

Thin Solid Films, Vol. 325, Iss. 1, 1998-07 ,pp. : 36-41

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Air pockets in thin porous platinum films studied by spectroscopic ellipsometry

By Arwin H.   Guo S.   Hedborg E.   Lundstrom I.  

Thin Solid Films, Vol. 293, Iss. 1, 1997-01 ,pp. : 179-184

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Beam size and collimation effects in spectroscopic ellipsometry of transparent films with optical thickness inhomogeneity

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