Spectroscopic ellipsometry on silicon-oxide films on silicon

By Jungk G.   Grabolla T.  

Thin Solid Films, Vol. 335, Iss. 1, 1998-11 ,pp. : 253-257

Elsevier

Access to resources Recommend Favorite

The effects of ambient oxygen pressure on the 1.54 μm photoluminescence of Er-doped silicon-rich silicon oxide films grown by laser ablation of a Si+Er target

By Ha J.S.   Sung G.Y.   Lee S.   Jang Y.R.   Yoo K.H.   Bae C.H.   Jeon J.S.   Nam S.H.   Park S.M.  

Applied Physics A, Vol. 79, Iss. 4-6, 2004-09 ,pp. : 1485-1488

Springer Publishing Company

Access to resources Recommend Favorite

Microscopic and spectroscopic analysis of the nature of conductivity changes during resistive switching in silicon‐rich silicon oxide

By  

PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol. 12, Iss. 1‐2, 2015-01 ,pp. : 211-217

John Wiley & Sons Inc

Access to resources Recommend Favorite

Fabrication of polycrystalline silicon films by Al‐induced crystallization of silicon‐rich oxide films

By  

PHYSICA STATUS SOLIDI - RAPID RESEARCH LETTERS (ELECTRONIC), Vol. 10, Iss. 9, 2016-09 ,pp. : 668-672

John Wiley & Sons Inc

Access to resources Recommend Favorite

Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry

By  

Materials Science Forum, Vol. 2016, Iss. 851, 2016-05 ,pp. : 199-204

Trans Tech Publications

Access to resources Recommend Favorite