Transmission electron microscopy studies of atomic layer deposition TiO 2 films grown on silicon

Author: Mitchell D.R.G.   Attard D.J.   Triani G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.441, Iss.1, 2003-09, pp. : 85-95

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content