On IEEE P1500's Standard for Embedded Core Test

Author: Marinissen E.J.  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.18, Iss.4-5, 2002-08, pp. : 365-383

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract