Author: Andreini A. Neva C. Renard L. Sironi G. Speroni F. Sponton L. Tampellini F. Tiziani R.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1377-1382
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Abstract
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