From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing

Author： Beaudoin F. Desplats R. Perdu P. Firiti A. Haller G. Pouget V. Lewis D.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1681-1686

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)

By Beauchene T. Tremouilles D. Lewis D. Perdu P. Fouillat P.

Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1577-1582

Elsevier

Access to resources Recommend Favorite

Low Cost BIST for Static and Dynamic Testing of ADCs

By Gloria Flores Maria

Journal of Electronic Testing, Vol. 21, Iss. 3, 2005-06 ,pp. : 283-290

Springer Publishing Company

Access to resources Recommend Favorite

SEE characteristics of small feature size devices by using laser backside testing

By Guoqiang Feng Shipeng Shangguan Yingqi Ma Jianwei Han

Journal of Semiconductors, Vol. 33, Iss. 1, 2012-01 ,pp. : 14008-14012

IOP Publishing

Access to resources Recommend Favorite

Experimental study on the single event effects in pulse width modulators by laser testing

By Wen Zhao Xiaoqiang Guo Wei Chen Hongxia Guo Dongsheng Lin Hanning Wang Yinhong Luo Lili Ding Yuanming Wang

Journal of Semiconductors, Vol. 36, Iss. 11, 2015-11 ,pp. : 115008-115012

IOP Publishing

Access to resources Recommend Favorite

Thermal Transient Testing*

By Székely V Rencz M Courtois** B

Microelectronics International, Vol. 14, Iss. 2, 1997-02 ,pp. : 8-10

Emerald Group Publishing Ltd

Access to resources Recommend Favorite