On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices

Author： Mura G. Vanzi M. Stangoni M. Ciappa M. Fichtner W.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1771-1776

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