Author: Tang W. Xu K. Wang P. Li X.
Publisher: Elsevier
ISSN: 0167-9317
Source: Microelectronic Engineering, Vol.66, Iss.1, 2003-04, pp. : 445-450
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Surface roughness of optical quartz substrate by chemical mechanical polishing
Journal of Semiconductors, Vol. 35, Iss. 11, 2014-11 ,pp. :