Influence of dots size and dots number fluctuations on the electrical characteristics of multi-nanocrystal memory devices

Author: Perniola L.   D Salvo B.   Ghibaudo G.   Foglio Para A.   Pananakakis G.   Baron T.   Lombardo S.  

Publisher: Elsevier

ISSN: 0038-1101

Source: Solid-State Electronics, Vol.47, Iss.10, 2003-10, pp. : 1637-1640

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Abstract