XPS characterization of tungsten-based contact layers on 4H-SiC

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Elsevier

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XPS and AES characterization of SiN x :H layers deposited by PECVD on Parylene C. Effects of thermal treatments on Parylene C surfaces and Parylene C/SiN x :H interlayers

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Characterization of Adsorbed Polymer Layers: Preparation, Determination of the Adsorbed Amount and Investigation of the Kinetics of Irreversible Adsorption

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XPS study of Au+ ion irradiated a-As 2 S 3 layers

By Stoycheva-Topalova R.   Assa J.   Buroff A.   Tzvetkov T.   Necheva S.   Drandarov N.   Vichev R.  

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Characterization of a barium surface by AES, XPS and SIMS

By Teodoro O.M.N.D.   Moutinho A.M.C.  

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