Application of atomic force microscopy for microindentation testing

By Petzold M.   Landgraf J.   Futing M.   Olaf J.M.  

Thin Solid Films, Vol. 264, Iss. 2, 1995-08 ,pp. : 153-158

Elsevier

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Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles

By Lagerpusch Ulrike   Anczykowski Boris   Nembach Eckhard  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 11, 2001-11 ,pp. : 2613-2628

Taylor & Francis Ltd

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Atomic force microscopy on cross-sections of optical coatings: A new method

By Duparre A.   Ruppe C.   Barna P.B.   Adamik M.   Pischow K.A.  

Thin Solid Films, Vol. 261, Iss. 1, 1995-06 ,pp. : 70-75

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Nanotribological characterization of industrial polytetrafluorethylene-based coatings by atomic force microscopy

By Podesta A.   Fantoni G.   Milani P.   Guida C.   Volponi S.  

Thin Solid Films, Vol. 419, Iss. 1, 2002-11 ,pp. : 154-159

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Contact and non-contact mode imaging by atomic force microscopy

By Morita S.   Fujisawa S.   Kishi E.   Ohta M.   Ueyama H.   Sugawara Y.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 138-142

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