Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis

Author: Krill C. E.   Birringer R.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.77, Iss.3, 1998-03, pp. : 621-640

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Abstract