Application of piezoresistive Wheatstone bridge cantilever in advanced atomic force microscopy techniques

Author: Gotszalk T.   Linnemann R.   Rangelow I. W.   Grabiec P.   Dumania P.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.81, Iss.4, 1996-10, pp. : 473-483

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Abstract