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International Journal of Electronics, Vol. 84, Iss. 1, 1998-01 ,pp. : 25-36

Taylor & Francis Ltd

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Degradation in polysilicon thin film transistors related to the quality of the polysilicon material

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Quantitative modelling of current gain and cut-off frequency at high injection levels at 77 and 300K in polysilicon emitter contact bipolar transistor

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International Journal of Electronics, Vol. 82, Iss. 5, 1997-05 ,pp. : 451-470

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On the characteristics of polycrystalline-silicon thin-film transistors; two-dimensional numerical analysis

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Device simulations of nanocrystalline silicon thin-film transistors

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