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Author: Toutah H. Tala-Ighil B. Llibre J.F. Boudart B. Mohammed-Brahim T. Bonnaud O.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1531-1535
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