Ionizing radiation-induced effects in an ion-implanted MOSFET: a two-dimensional analytical model

Author： Dasgupta S.   Chauhan R. K.   Singh G.   Chakrabarti P.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3060

Source： International Journal of Electronics, Vol.89, Iss.4, 2002-04, pp. : 277-288

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