Compact modeling of symmetrical double-gate MOSFETs including carrier confinement and short-channel effects

Author： Munteanu D.   Autran J. L.   Loussier X.   Harrison S.   Cerutti R.  

Publisher： Taylor & Francis Ltd

ISSN： 0892-7022

Source： Molecular Simulation, Vol.33, Iss.7, 2007-06, pp. : 605-611

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