Off-state breakdown characteristics of InGaP-based high-barrier gate heterostructure field-effect transistors

Author: Yu K-H.   Lin K-W.   Cheng S-Y.   Cheng C-C.   Chen J-Y.   Wu C-Z.   Liu W-C.  

Publisher: Academic Press

ISSN: 0749-6036

Source: Superlattices and Microstructures, Vol.30, Iss.5, 2001-11, pp. : 231-239

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