Author: Hsu Yung-Yu Gonzalez Mario Bossuyt Frederick Axisa Fabrice Vanfleteren Jan Vandevelde Bart Wolf Ingrid de
Publisher: Emerald Group Publishing Ltd
ISSN: 1356-5362
Source: Microelectronics International, Vol.27, Iss.1, 2010-01, pp. : 33-38
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Abstract