Fabrication of a TEM sample of ion-irradiated material using focused ion beam microprocessing and low-energy Ar ion milling

By Jin Hyung-Ha   Shin Chansun   Kwon Junhyun  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 463-468

Oxford University Press

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Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

By Sasaki Hirokazu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

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Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique

By Choi Pyuck-Pa   Kwon Young-Soon   Kim Ji-Soon   Al-Kassab Tala’at  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 43-49

Oxford University Press

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Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling

By Eberg Espen   Monsen smund F.   Tybell Thomas   van Helvoort Antonius T. J.   Holmestad Randi  

Journal of Electron Microscopy, Vol. 57, Iss. 6, 2008-12 ,pp. : 175-179

Oxford University Press

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Focused ion beam preparation techniques dedicated for the fabrication of TEM lamellae of fibre-reinforced composites

By Mucha Herbert  

Journal of Electron Microscopy, Vol. 54, Iss. 1, 2005-01 ,pp. : 43-49

Oxford University Press

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