HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method

Author： Tanaka Masaki   Higashida Kenji   Fukui Toru   Yokote Tatsuo  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.53, Iss.5, 2004-10, pp. : 505-509

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