Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs 0.5 Sb 0.5

By Shindo* Daisuke   Ikematsu1 Yoichi   Lee Chang‐Woo   Suzuki2 Tohru   Ichihashi3 Toshinari  

Journal of Electron Microscopy, Vol. 51, Iss. 1, 2002-03 ,pp. : 29-34

Oxford University Press

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First observation of SiO 2 /Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy

By Tanaka* Nobuo  

Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. : 69-73

Oxford University Press

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Development of a high temperatureatmospheric pressure environmental cell for high-resolution TEM

By Yaguchi Toshie   Suzuki Makoto   Watabe Akira   Nagakubo Yasuhira   Ueda Kota   Kamino Takeo  

Journal of Electron Microscopy, Vol. 60, Iss. 3, 2011-06 ,pp. : 217-225

Oxford University Press

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Simulation of Electron Trajectories of Wien Filter for High-Resolution EELS Installed in TEM

By Tsuno Katsushige  

Journal of Electron Microscopy, Vol. 45, Iss. 5, 1996-10 ,pp. : 417-427

Oxford University Press

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Prospects of atomic resolution imaging with an aberration–corrected STEM

By Ishizuka K.  

Journal of Electron Microscopy, Vol. 50, Iss. 4, 2001-08 ,pp. : 291-305

Oxford University Press

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