Quantitative backscattered electron imaging of field emission scanning electron microscopy for discrimination of nano-scale elements with nm-order spatial resolution

Author： Kim Hyonchol   Negishi Tsutomu   Kudo Masato   Takei Hiroyuki   Yasuda Kenji  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.59, Iss.5, 2010-10, pp. : 379-385

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

From the physics of secondary electron emission to image contrasts in scanning electron microscopy

By Cazaux Jacques  

Journal of Electron Microscopy, Vol. 61, Iss. 5, 2012-10 ,pp. : 261-284

Oxford University Press

Access to resources Recommend Favorite

Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy

By Ishitani Tohru   Kamiya Chisato   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 54, Iss. 2, 2005-04 ,pp. : 85-97

Oxford University Press

Access to resources Recommend Favorite

High-resolution low-dose scanning transmission electron microscopy

By Buban James P.   Ramasse Quentin   Gipson Bryant   Browning Nigel D.   Stahlberg Henning  

Journal of Electron Microscopy, Vol. 59, Iss. 2, 2010-04 ,pp. : 103-112

Oxford University Press

Access to resources Recommend Favorite

Evaluation of both image resolution and contrast-to-noise ratio in scanning electron microscopy

By Ishitani Tohru   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 56, Iss. 4, 2007-08 ,pp. : 145-151

Oxford University Press

Access to resources Recommend Favorite

High-resolution spin-polarized scanning electron microscopy (spin SEM)

By Kohashi Teruo   Konoto Makoto   Koike Kazuyuki  

Journal of Electron Microscopy, Vol. 59, Iss. 1, 2010-02 ,pp. : 43-52

Oxford University Press

Access to resources Recommend Favorite