Depth sectioning of aligned crystals with the aberration-corrected scanning transmission electron microscope

By Borisevich Albina Y.   Lupini Andrew R.   Travaglini Samuel   Pennycook Stephen J.  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 7-12

Oxford University Press

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In situ observation of Pt nanoparticles on graphene layers under high temperature using aberration-corrected transmission electron microscopy

By Hashimoto Ayako   Takeguchi Masaki  

Journal of Electron Microscopy, Vol. 61, Iss. 6, 2012-12 ,pp. : 409-413

Oxford University Press

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First observation of SiO 2 /Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy

By Tanaka* Nobuo  

Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. : 69-73

Oxford University Press

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Direct imaging of lithium atoms in LiV 2 O 4 by spherical aberration-corrected electron microscopy

By Oshima Yoshifumi   Sawada Hidetaka   Hosokawa Fumio   Okunishi Eiji   Kaneyama Toshikatsu   Kondo Yukihito   Niitaka Seiji   Takagi Hidenori   Tanishiro Yasumasa   Takayanagi Kunio  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 457-461

Oxford University Press

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Calculations of spherical aberration‐corrected imaging behaviour

By Chang Lan Yun  

Journal of Electron Microscopy, Vol. 52, Iss. 4, 2003-09 ,pp. : 359-364

Oxford University Press

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