Ultrasound interferometry for the evaluation of thickness and adhesion of thin layers

Author: Santos J.B.   Santos M.J.  

Publisher: Inderscience Publishers

ISSN: 0268-1900

Source: International Journal of Materials and Product Technology, Vol.41, Iss.1-4, 2011-05, pp. : 153-161

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract