Parts screening for ESD susceptibility

Author： Gorlov M.   Emel’yanov V.   Rubtsevich I.   Smirnov D.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7397

Source： Russian Microelectronics, Vol.34, Iss.1, 2005-01, pp. : 22-29

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