Effect of high temperature storage test on reliability of eutectic Sn–Cu/ENIG solder joint

Author: Yoon J.-W.   Kim S.-W.   Jung S.-B.  

Publisher: Maney Publishing

ISSN: 1743-2847

Source: Materials Science and Technology, Vol.23, Iss.4, 2007-04, pp. : 411-416

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Abstract