Bias-stability improvement using Al₂O₃ interfacial dielectrics in a-InSnZnO thin-film transistors

Author： Jang Kyungsoo Raja Jayapal Kim Jiwoong Park Cheolmin Lee Youn-Jung Yang Jaehyun Kim Hyoungsub Yi Junsin

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.28, Iss.8, 2013-08, pp. : 85015-85019

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