EUV spectral lines of highly-charged Hf, Ta and Au ions observed with an electron beam ion trap

Author: Draganić Ilija N   Ralchenko Yuri   Reader Joseph   Gillaspy J D   Tan Joseph N   Pomeroy Joshua M   Brewer Samuel M   Osin Dmitry  

Publisher: IOP Publishing

ISSN: 0953-4075

Source: Journal of Physics B: Atomic, Molecular and Optical Physics, Vol.44, Iss.2, 2011-01, pp. : 25001-25012

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