

Author: Bettinali Livio Tosti Silvano Pizzuto Aldo
Publisher: Springer Publishing Company
ISSN: 0022-2291
Source: Journal of Low Temperature Physics, Vol.174, Iss.1-2, 2014-01, pp. : 64-75
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content








Electrical properties of Ta 2 O 5 thin films deposited on Cu
By Ezhilvalavan S. Tseng T.-Y.
Thin Solid Films, Vol. 360, Iss. 1, 2000-02 ,pp. :


Alloying and electrical properties of evaporated Cu-In bilayer thin films
By Nakano T. Suzuki T. Ohnuki N. Baba S.
Thin Solid Films, Vol. 334, Iss. 1, 1998-12 ,pp. :