Author: Edon V. Hugon M. -C. Agius B. Bastos K. P. Miotti L. Driemeier C. Salvador L. Krug C. Baumvol I. J. R. Eypert C. Durand O.
Publisher: Taylor & Francis Ltd
ISSN: 1058-4587
Source: Integrated Ferroelectrics, Vol.97, Iss.1, 2008-01, pp. : 129-142
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