Author: Dongyan Tao Yu Cheng Jingming Liu Jie Su Tong Liu Fengyun Yang Fenghua Wang Kewei Cao Zhiyuan Dong Youwen Zhao
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.7, 2015-07, pp. : 73006-73010
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Romero O.S. Aragon A.A. Rahimi N. Shima D. Addamane S. Rotter T.J. Mukherjee S. Dawson L.R. Lester L.F. Balakrishnan G.
Journal of Electronic Materials, Vol. 43, Iss. 4, 2014-04 ,pp. :
By Yang Chien-Cheng Koh Pao-Ling Wu Meng-Chyi Lee Chih-hao Chi Gou-Chung
Journal of Electronic Materials, Vol. 28, Iss. 10, 1999-10 ,pp. :