Nondestructive measurement of thermal contact resistance for the power vertical double-diffused metal-oxide-semiconductor

Author: Rui Li   Chun-Sheng Guo   Shi-Wei Feng   Lei Shi   Hui Zhu   Lin Wang  

Publisher: IOP Publishing

E-ISSN: 1741-4199|24|7|76601-76603

ISSN: 1674-1056

Source: Chinese Physics B, Vol.24, Iss.7, 2015-07, pp. : 76601-76603

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