MEMS probes for on-wafer RF microwave characterization of future microelectronics: design, fabrication and characterization

Author: Marzouk Jaouad   Arscott Steve   Haddadi Kamel   Lasri Tuami   Boyaval Christophe   Dambrine Gilles   Marzouk Jaouad  

Publisher: IOP Publishing

E-ISSN: 1361-6439|25|7|75024-75034

ISSN: 0960-1317

Source: Journal of Micromechanics and Microengineering, Vol.25, Iss.7, 2015-07, pp. : 75024-75034

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