Nanoscale Mapping of Ag Anode Surface Potential for High-Performance T -Organic Light-Emitting Diode Using Kelvin Probe Force Microscopy

By Lee Kyu Young   Kim Soo In   Kim Joo Young   Kwon Ku Eun   Lee Chang Woo  

Journal of Nanoscience and Nanotechnology, Vol. 13, Iss. 9, 2013-09 ,pp. : 6349-6352

American Scientific Publishers

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Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy

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Nanotechnology, Vol. 26, Iss. 34, 2015-01 ,pp. : 345702-345710

IOP Publishing

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Molecular-scale surface structures of oligo(ethylene glycol)-terminated self-assembled monolayers investigated by frequency modulation atomic force microscopy in aqueous solution

By Inada N   Asakawa H   Matsumoto Y   Fukuma T  

Nanotechnology, Vol. 25, Iss. 30, 2014-08 ,pp. : 305602-305611

IOP Publishing

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Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy

By Dagdeviren Omur E   Götzen Jan   Hölscher Hendrik   Altman Eric I   Schwarz Udo D  

Nanotechnology, Vol. 27, Iss. 6, 2016-02 ,pp. : 65703-65712

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Molecular-scale quantitative charge density measurement of biological molecule by frequency modulation atomic force microscopy in aqueous solutions

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