Direct Probing of Nanodimensioned Oxide Multilayers with the Aid of Focused Ion Beam Milling

E-ISSN： 1521-4095|23|39|4543-4548

ISSN： 0935-9648

Source： ADVANCED MATERIALS, Vol.23, Iss.39, 2011-10, pp. : 4543-4548

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Investigation of sub-surface damage during sliding wear of alumina using focused ion-beam milling

By Chaiwan S. Hoffman M. Munroe P. Stiefel U.

Wear, Vol. 252, Iss. 7, 2002-04 ,pp. : 531-539

Elsevier

Access to resources Recommend Favorite

Application of focused ion beam milling to cross-sectional TEM specimen preparation of industrial materials including heterointerfaces

By Kuroda K. Takahashi M. Kato T. Saka H. Tsuji S.

Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 92-96

Elsevier

Access to resources Recommend Favorite

Residual stress measurement at the micrometer scale: focused ion beam (FIB) milling and nanoindentation testing

By Sebastiani M.

Philosophical Magazine, Vol. 91, Iss. 7-9, 2011-03 ,pp. : 1121-1136

Taylor & Francis Ltd

Access to resources Recommend Favorite

Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1–2 nm by Focused Ion Beam Milling

ADVANCED MATERIALS, Vol. 27, Iss. 19, 2015-05 ,pp. : 3002-3006

John Wiley & Sons Inc

Access to resources Recommend Favorite

The Analyse of Nanocomposite Thin Coatings Using Specimens Prepared by Focused Ion Beam Milling

Materials Science Forum, Vol. 2017, Iss. 891, 2017-04 ,pp. : 579-585

Trans Tech Publications

Access to resources Recommend Favorite