Absolute refinement of crystal structures by X‐ray phase measurements

Publisher： John Wiley & Sons Inc

E-ISSN： 2053-2733|71|3|291-296

ISSN： 0108-7673

Source： ACTA CRYSTALLOGRAPHICA SECTION A (ELECTRONIC), Vol.71, Iss.3, 2015-05, pp. : 291-296

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Abstract

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