Ab initio simulation of diffractometer instrumental function for high‐resolution X‐ray diffraction

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|3|679-689

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.3, 2015-06, pp. : 679-689

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