In situ defect annealing of swift heavy ion irradiated CeO2 and ThO2 using synchrotron X‐ray diffraction and a hydrothermal diamond anvil cell

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|3|711-717

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.3, 2015-06, pp. : 711-717

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