Element‐specific structural analysis of Si/B4C using resonant X‐ray reflectivity

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|3|786-796

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.3, 2015-06, pp. : 786-796

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