X‐ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient
Publisher： John Wiley & Sons Inc
E-ISSN： 1600-5767|48|3|853-856
ISSN： 0021-8898
Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.3, 2015-06, pp. : 853-856
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