Gate-bias stress-dependent photoconductive characteristics of multi-layer MoS2 field-effect transistors

Author： Cho Kyungjune   Kim Tae-Young   Park Woanseo   Park Juhun   Kim Dongku   Jang Jingon   Jeong Hyunhak   Hong Seunghun   Lee Takhee  

Publisher： IOP Publishing

ISSN： 0957-4484

Source： Nanotechnology, Vol.25, Iss.15, 2014-04, pp. : 155201-155207

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