Related content

Constant-stress accelerated life test of white organic light-emitting diode based on least square method under Weibull distribution

By Zhang Jianping   Liu Chao   Cheng Guoliang   Chen Xiao   Wu Jionglei   Zhu Qunzhi   Zhang Laichang  

Journal of Information Display, Vol. 15, Iss. 2, 2014-04 ,pp. : 71-75

Taylor & Francis Ltd

Access to resources Recommend Favorite

Fast power cycling test for insulated gate bipolar transistor modules in traction application

By Held M.   Jacob P.   Nicoletti G.   Scacco P.   Poech M.-H.  

International Journal of Electronics, Vol. 86, Iss. 10, 1999-10 ,pp. : 1193-1204

Taylor & Francis Ltd

Access to resources Recommend Favorite

High temperature reliability on automotive power modules verified by power cycling tests up to 150 o C

By Coquery G.   Lefranc G.   Licht T.   Lallemand R.   Seliger N.   Berg H.  

Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1871-1876

Elsevier

Access to resources Recommend Favorite

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

By Chunsheng Guo   Yanfeng Zhang   Ning Wan   Hui Zhu   Shiwei Feng  

Journal of Semiconductors, Vol. 35, Iss. 8, 2014-08 ,pp. : 84010-84014

IOP Publishing

Access to resources Recommend Favorite

Storage life of power switching transistors based on performance degradation data

By Haochun Qi   Xiaoling Zhang   Xuesong Xie   Changzhi Lü   Chengju Chen   Li Zhao  

Journal of Semiconductors, Vol. 35, Iss. 4, 2014-04 ,pp. : 44006-44011

IOP Publishing

Access to resources Recommend Favorite