Laue pattern analysis for two‐dimensional strain mapping in light‐ion‐implanted polycrystals

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5767|48|4|990-999

ISSN: 0021-8898

Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.4, 2015-08, pp. : 990-999

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Abstract