Investigations on possibilities of inline inspection of high aspect ratio microstructures

Author: Engelke Rainer   Ahrens Gisela   Arndt-Staufenbiehl Norbert   Kopetz Stefan   Wiesauer Karin   Löchel Bernd   Schröder Henning   Kastner Johann   Neyer Andreas   Stifter David   Grützner Gabi  

Publisher: Springer Publishing Company

ISSN: 0946-7076

Source: Microsystem Technologies, Vol.13, Iss.3-4, 2007-02, pp. : 319-325

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